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Technical library

The Megger technical library provides access to a range of additional content and resources such as technical guides, application notes and more. Use the filters to browse specific content (e.g. application notes) or refine your search to a particular electrical application area. 

 

If you would like to see the content we have available on a particular subject or need to locate some software, simply enter a search below. Please note, you will need to create an account to access some resources.

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    Showing item(s) 1 - 10 of 122 in total
Determining harmonic direction
 Harmonics are caused by non-linear loads. Linear loads draw a linear current that follows the changing voltage of the AC waveform. Non-linear loads draw current pulses periodically, which creates distorted waveforms.
Published: 21 May 2018
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Testing appliances with long power cords
When testing appliances with long power cords, usually longer than 5m, it can be necessary to allow for the additional cord resistance. Most modern Portable Appliance Testers have pre programmed pass limits. These are based on the limits specified in the Code of Practise for In-Service Inspection and Testing of Electrical Equipment. However, the true pass limit depends on the appliance to be tested. The pre-programmed limit may not be suitable for all appliances. Moving the goal posts can be justified in particular circumstances when a test initially fails.
Published: 8 March 2018
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Renaming test files on the MPQ units
An application note explaining how to rename test files on the MPQ test units. This feature can be used to keep track of recordings if the user has to record on multiple locations before downloading the data to a computer.
Published: 5 January 2018
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Transferring data from the MPQ to the PC
Data can be transferred from the MPQ to your PC in 3 ways – direct download, via SD card, and via USB stick. All 3 methods are discussed in this article.
Published: 5 January 2018
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Measuring current on a CT secondary circuit
In some cases, measuring actual current on the primary conductor is not possible and the user may have to measure current on the secondary circuit of a CT. In this case, the MPQ can be programmed to display the actual primary current values instead of the current measured on the CT secondary circuit. This is done by following the steps given below.
Published: 5 January 2018
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Measuring operational low voltage networks
Low voltage cable faults are often unstable, so they can only be located when the cable is conducting live voltage. Testing under these conditions is extremely hazardous, so separations filters, as well as constructional safety methods, should be employed at all times.
Published: 18 December 2017
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Low voltage network structures
Low voltage networks are a huge national investment, under daily pressure to give out power for hours at a time to a plethora of electrical appliances. It is therefore essential that their cables and transformers are tested often to prevent outage. To effectively test the components in low voltage networks, it’s important to know the different types of systems within them and how they are structured.
Published: 18 December 2017
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Intro to fault location in low voltage networks
Fault occurrences in medium voltage networks are usually covered by redundancy in the system which, with appropriate switching, usually ensures a relatively uninterrupted continuation of the supply for the customer. A lengthy wait until the fault can be corrected only results in the increased risk of a second failure in this area, creating a customer outage that cannot be restored by switching.
Published: 18 December 2017
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Examples of fault location
In branched low voltage networks, low-resistance faults, interruptions and large changes in impedance can only be located by comparing fault-free and defective cores.
Published: 18 December 2017
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Pre-location based on impulse reflection methods
The use of T-branches in low voltage networks makes the evaluation of TDR traces considerably more difficult. Only through comparative measurements of fault-free and defective wires can possible results be achieved. The test pulses of the Teleflex are partially reflected at the T-joint with a negative algebraic sign, while test pulses that continue are simultaneously reduced in amplitude. The amount of reflection depends on the impedance in the main line and the continuing line.
Published: 18 December 2017
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  • Showing item(s) 1 - 10 of 122 in total